Inventor · disambiguated record
Grady L. Giles
Also filed as: GILES GRADY · GILES GRADY L · GILES GRADY LAWRENCE
16 granted patents·1 pending application·848 citations·filing 1985–2023
95Inventor score
Top patents by PatentIndex Score
17 records- 0193US6085334AMethod and apparatus for testing an integrated memory deviceMOTOROLA INC·Filed 1998·Granted Jul 4, 2000·216 cites·24 claims
- 0292US6272588B1Method and apparatus for verifying and characterizing data retention time in a DRAM using built-in test circuitryMOTOROLA INC·Filed 1997·Granted Aug 7, 2001·113 cites·11 claims
- 0392US5812561AScan based testing of an integrated circuit for compliance with timing specificationsMOTOROLA INC·Filed 1996·Granted Sep 22, 1998·141 cites·22 claims
- 0488US6167484AMethod and apparatus for leveraging history bits to optimize memory refresh performanceMOTOROLA INC·Filed 1998·Granted Dec 26, 2000·78 cites·31 claims
- 0585US5889788AWrapper cell architecture for path delay testing of embedded core microprocessors and method of operationMOTOROLA INC·Filed 1997·Granted Mar 30, 1999·127 cites·35 claims
- 0683US11657892B1Repairable latch arrayADVANCED MICRO DEVICES INC·Filed 2021·Granted May 23, 2023·1 cites·20 claims
- 0781US4680760AAccelerated test apparatus and support logic for a content addressable memoryMOTOROLA INC·Filed 1985·Granted Jul 14, 1987·42 cites·5 claims
- 0876US5774476ATiming apparatus and timing method for wrapper cell speed path testing of embedded cores within an integrated circuitMOTOROLA INC·Filed 1997·Granted Jun 30, 1998·39 cites·38 claims
- 0976US5015875AToggle-free scan flip-flopMOTOROLA INC·Filed 1989·Granted May 14, 1991·56 cites·28 claims
- 1074US9046574B2Test circuit having scan warm-upADVANCED MICRO DEVICES INC·Filed 2012·Granted Jun 2, 2015·3 cites·23 claims
- 1172US9194914B2Power supply monitor for detecting faults during scan testingADVANCED MICRO DEVICES INC·Filed 2013·Granted Nov 24, 2015·2 cites·20 claims
- 1271US12100464B2Repairable latch arrayADVANCED MICRO DEVICES INC·Filed 2023·Granted Sep 24, 2024·0 cites·20 claims
- 1351US7925937B2Apparatus for testing embedded memory read pathsADVANCED MICRO DEVICES INC·Filed 2008·Granted Apr 12, 2011·3 cites·18 claims
- 1450US5220526AMethod and apparatus for indicating a duplication of entries in a content addressable storage deviceMOTOROLA INC·Filed 1991·Granted Jun 15, 1993·14 cites·24 claims
- 1547US5369752AMethod and apparatus for shifting data in an array of storage elements in a data processing systemMOTOROLA INC·Filed 1992·Granted Nov 29, 1994·12 cites·19 claims
- 1643US8103924B2Test access mechanism for multi-core processor or other integrated circuitGILES GRADY L·Filed 2008·Granted Jan 24, 2012·1 cites·20 claims
- 1733US2012159274A1Apparatus to facilitate built-in self-test data collectionBALAKRISHNAN KEDARNATH J·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →