Inventor · disambiguated record
William C. Bruce, Jr.
Also filed as: BRUCE JR WILLIAM C · BRUCE JR WILLIAM CLAYTON · BRUCE WILLIAM · BRUCE WILLIAM C
14 granted patents·625 citations·filing 1980–2007
94Inventor score
Top patents by PatentIndex Score
14 records- 0193US6085334AMethod and apparatus for testing an integrated memory deviceMOTOROLA INC·Filed 1998·Granted Jul 4, 2000·216 cites·24 claims
- 0288US6167484AMethod and apparatus for leveraging history bits to optimize memory refresh performanceMOTOROLA INC·Filed 1998·Granted Dec 26, 2000·78 cites·31 claims
- 0387US6832280B2Data processing system having an adaptive priority controllerFREESCALE SEMICONDUCTOR INC·Filed 2001·Granted Dec 14, 2004·53 cites·37 claims
- 0485US4980888AMemory testing systemDIGITAL EQUIPMENT CORP·Filed 1988·Granted Dec 25, 1990·48 cites·28 claims
- 0582US4380798ASemaphore register including ownership bitsMOTOROLA INC·Filed 1980·Granted Apr 19, 1983·63 cites·3 claims
- 0678US5347523AData processing system having serial self address decoding and method of operationMOTOROLA INC·Filed 1993·Granted Sep 13, 1994·44 cites·22 claims
- 0769US7185251B2Method and apparatus for affecting a portion of an integrated circuitFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Feb 27, 2007·12 cites·8 claims
- 0866US5517637AMethod for testing a test architecture within a circuitMOTOROLA INC·Filed 1994·Granted May 14, 1996·32 cites·29 claims
- 0953US5646949AMethod and apparatus for generating instructions for use in testing a microprocessorMOTOROLA INC·Filed 1996·Granted Jul 8, 1997·31 cites·31 claims
- 1045US4344133AMethod for synchronizing hardware and softwareMOTOROLA INC·Filed 1980·Granted Aug 10, 1982·13 cites·6 claims
- 1144US7581151B2Method and apparatus for affecting a portion of an integrated circuitFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 25, 2009·0 cites·20 claims
- 1244US4409653AMethod of performing a clear and wait operation with a single instructionMOTOROLA INC·Filed 1981·Granted Oct 11, 1983·13 cites·5 claims
- 1343US4679194ALoad double test instructionMOTOROLA INC·Filed 1984·Granted Jul 7, 1987·14 cites·10 claims
- 1439US5912562AQuiescent current monitor circuit for wafer level integrated circuit testingMOTOROLA INC·Filed 1997·Granted Jun 15, 1999·8 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →