Inventor · disambiguated record

Masayasu Katayama

Also filed as: KATAYAMA MASAYASU

1 granted patent·55 citations·filing 1995–1995

49Inventor score

Technology areasG01R

Files withCO OPERATIVE FACILITY FOR AGIN1

Top patents by PatentIndex Score

1 record

0175US5534786ABurn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in testsCO OPERATIVE FACILITY FOR AGIN·Filed 1995·Granted Jul 9, 1996·55 cites·2 claims

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