Inventor · disambiguated record
Hirofumi Miyao
Also filed as: MIYAO HIROFUMI
4 granted patents·1 pending application·7 citations·filing 2001–2022
62Inventor score
Technology areasH01J
Files withJEOL LTD5
Top patents by PatentIndex Score
5 records- 0162US7351970B2Scanning electron microscopeJEOL LTD·Filed 2006·Granted Apr 1, 2008·2 cites·11 claims
- 0258US6653629B2Specimen inspection instrumentJEOL LTD·Filed 2001·Granted Nov 25, 2003·5 cites·16 claims
- 0353US12222658B2Stage apparatus and electron beam lithography systemJEOL LTD·Filed 2022·Granted Feb 11, 2025·0 cites·6 claims
- 0442US2008067443A1Apparatus for Preparing Cross-Sectional Specimen Using Ion BeamJEOL LTD·Filed 2007·Application pending·0 cites
- 0540US7531794B2Method and apparatus for preparing specimenJEOL LTD·Filed 2006·Granted May 12, 2009·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →