Inventor · disambiguated record
Jill Wang
Also filed as: WANG JILL
2 granted patents·29 citations·filing 2009–2009
59Inventor score
Top patents by PatentIndex Score
2 records- 0192US8108060B2System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architectureTSEN ANDY·Filed 2009·Granted Jan 31, 2012·25 cites·19 claims
- 0265US8392009B2Advanced process control with novel sampling policyFEI WANG JO·Filed 2009·Granted Mar 5, 2013·4 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →