Inventor · disambiguated record
Kouji Uesaka
Also filed as: UESAKA KOUJI
4 granted patents·8 citations·filing 2003–2020
64Inventor score
Top patents by PatentIndex Score
4 records- 0172US8736295B2Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing methodWATANABE YUICHI·Filed 2010·Granted May 27, 2014·4 cites·9 claims
- 0247US7096396B2Test system for circuitsFUJITSU LTD·Filed 2003·Granted Aug 22, 2006·4 cites·19 claims
- 0344US11468026B2Information processing apparatus, information processing method, and recording medium recording information processing programFUJITSU LTD·Filed 2020·Granted Oct 11, 2022·0 cites·9 claims
- 0441US8941841B2Displacement measurement device, displacement measurement method, and displacement measurement programFUJITSU LTD·Filed 2013·Granted Jan 27, 2015·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →