Inventor · disambiguated record
Benoit Nadeau-Dostie
Also filed as: NADEAU-DOSTIE BENOIT
49 granted patents·5 pending applications·2,337 citations·filing 1988–2022
99Inventor score
Files withLOGICVISION INC32SIEMENS IND SOFTWARE INC8LOGIC VISION INC5NORTHERN TELECOM LTD4MENTOR GRAPHICS CORP1
Top patents by PatentIndex Score
54 records- 0199US6829730B2Method of designing circuit having multiple test access ports, circuit produced thereby and method of using sameLOGICVISION INC·Filed 2001·Granted Dec 7, 2004·192 cites·51 claims
- 0297US7757135B2Method and apparatus for storing and distributing memory repair informationMENTOR GRAPHICS CORP·Filed 2007·Granted Jul 13, 2010·70 cites·23 claims
- 0396US6671839B1Scan test method for providing real time identification of failing test patterns and test bist controller for use therewithLOGICVISION INC·Filed 2002·Granted Dec 30, 2003·96 cites·70 claims
- 0496US6000051AMethod and apparatus for high-speed interconnect testingLOGIC VISION INC·Filed 1997·Granted Dec 7, 1999·140 cites·43 claims
- 0596US5923676ABist architecture for measurement of integrated circuit delaysLOGIC VISION INC·Filed 1996·Granted Jul 13, 1999·146 cites·31 claims
- 0696US5349587AMultiple clock rate test apparatus for testing digital systemsNORTHERN TELECOM LTD·Filed 1992·Granted Sep 20, 1994·201 cites·19 claims
- 0795US11495315B1Configurable built-in self-repair chain for fast repair data loadingSIEMENS IND SOFTWARE INC·Filed 2021·Granted Nov 8, 2022·4 cites·24 claims
- 0894US6510534B1Method and apparatus for testing high performance circuitsLOGICVISION INC·Filed 2000·Granted Jan 21, 2003·82 cites·44 claims
- 0994US6327684B1Method of testing at-speed circuits having asynchronous clocks and controller for use therewithLOGICVISION INC·Filed 1999·Granted Dec 4, 2001·119 cites·31 claims
- 1093US6442722B1Method and apparatus for testing circuits with multiple clocksLOGICVISION INC·Filed 1999·Granted Aug 27, 2002·220 cites·34 claims
- 1192US6760874B2Test access circuit and method of accessing embedded test controllers in integrated circuit modulesLOGICVISION INC·Filed 2002·Granted Jul 6, 2004·54 cites·53 claims
- 1292US6745359B2Method of masking corrupt bits during signature analysis and circuit for use therewithLOGICVISION INC·Filed 2002·Granted Jun 1, 2004·49 cites·55 claims
- 1391US7370251B2Method and circuit for collecting memory failure informationLOGICVISION INC·Filed 2003·Granted May 6, 2008·55 cites·54 claims
- 1490US7617425B2Method for at-speed testing of memory interface using scanLOGICVISION INC·Filed 2006·Granted Nov 10, 2009·20 cites·27 claims
- 1589US4969148ASerial testing technique for embedded memoriesNORTHERN TELECOM LTD·Filed 1989·Granted Nov 6, 1990·81 cites·9 claims
- 1688US6363520B1Method for testability analysis and test point insertion at the RT-level of a hardware development language (HDL) specificationLOGICVISION INC·Filed 1998·Granted Mar 26, 2002·85 cites·36 claims
- 1788US6115827AClock skew management method and apparatusLOGICVISION INC·Filed 1998·Granted Sep 5, 2000·72 cites·43 claims
- 1886US7155651B2Clock controller for at-speed testing of scan circuitsLOGICVISION INC·Filed 2004·Granted Dec 26, 2006·31 cites·29 claims
- 1986US6615392B1Hierarchical design and test method and system, program product embodying the method and integrated circuit produced therebyLOGICVISION INC·Filed 2000·Granted Sep 2, 2003·44 cites·75 claims
- 2085US6763489B2Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit descriptionLOGICVISION INC·Filed 2001·Granted Jul 13, 2004·31 cites·65 claims
- 2184US6536008B1Fault insertion method, boundary scan cells, and integrated circuit for use therewithLOGIC VISION INC·Filed 1998·Granted Mar 18, 2003·57 cites·76 claims
- 2284US5812469AMethod and apparatus for testing multi-port memoryLOGIC VISION INC·Filed 1996·Granted Sep 22, 1998·48 cites·4 claims
- 2381US6330681B1Method and apparatus for controlling power level during BISTLOGICVISION INC·Filed 1998·Granted Dec 11, 2001·46 cites·23 claims
- 2478US11430537B2Error-correcting code-assisted memory repairSIEMENS IND SOFTWARE INC·Filed 2020·Granted Aug 30, 2022·1 cites·18 claims
- 2578US5323400AScan cell for weighted random pattern generation and method for its operationNORTHERN TELECOM LTD·Filed 1991·Granted Jun 21, 1994·42 cites·15 claims
- 2677US6145105AMethod and apparatus for scan testing digital circuitsLOGICVISION INC·Filed 1998·Granted Nov 7, 2000·42 cites·28 claims
- 2776US5900753AAsynchronous interfaceLOGICVISION INC·Filed 1997·Granted May 4, 1999·76 cites·67 claims
- 2875US7194669B2Method and circuit for at-speed testing of scan circuitsLOGICVISION INC·Filed 2003·Granted Mar 20, 2007·17 cites·45 claims
- 2974US6457161B1Method and program product for modeling circuits with latch based designFiled 2001·Granted Sep 24, 2002·22 cites·25 claims
- 3073US8516317B2Methods for at-speed testing of memory interfaceNADEAU-DOSTIE BENOIT·Filed 2011·Granted Aug 20, 2013·6 cites·31 claims
- 3173US4996691AIntegrated circuit testing method and apparatus and integrated circuit devices for use therewithNORTHERN TELECOM LTD·Filed 1988·Granted Feb 26, 1991·28 cites·11 claims
- 3272US6868532B2Method and program product for designing hierarchical circuit for quiescent current testing and circuit produced therebyLOGICVISION INC·Filed 2001·Granted Mar 15, 2005·15 cites·78 claims
- 3371US6614263B2Method and circuitry for controlling clocks of embedded blocks during logic bist test modeLOGICVISION INC·Filed 2002·Granted Sep 2, 2003·14 cites·54 claims
- 3470US7219282B2Boundary scan with strobed pad driver enableLOGICVISION INC·Filed 2003·Granted May 15, 2007·14 cites·7 claims
- 3570US6738938B2Method for collecting failure information for a memory using an embedded test controllerLOGICVISION INC·Filed 2002·Granted May 18, 2004·17 cites·52 claims
- 3669US7139946B2Method and test circuit for testing memory internal write enableLOGICVISION INC·Filed 2003·Granted Nov 21, 2006·16 cites·49 claims
- 3765US8683280B2Test generator for low power built-in self-testRAJSKI JANUSZ·Filed 2012·Granted Mar 25, 2014·1 cites·20 claims
- 3864US6487688B1Method for testing circuits with tri-state drivers and circuit for use therewithLOGICVISION INC·Filed 1999·Granted Nov 26, 2002·25 cites·30 claims
- 3964US6046946AMethod and apparatus for testing multi-port memory using shadow readLOGIC VISION INC·Filed 1998·Granted Apr 4, 2000·19 cites·21 claims
- 4061US7188274B2Memory repair analysis method and circuitLOGICVISION INC·Filed 2004·Granted Mar 6, 2007·12 cites·46 claims
- 4160US11961576B2Method and apparatus for processing memory repair informationSIEMENS IND SOFTWARE INC·Filed 2019·Granted Apr 16, 2024·1 cites·20 claims
- 4260US6862717B2Method and program product for designing hierarchical circuit for quiescent current testingLOGICVISION INC·Filed 2001·Granted Mar 1, 2005·9 cites·79 claims
- 4359US7424656B2Clocking methodology for at-speed testing of scan circuits with synchronous clocksLOGICVISION INC·Filed 2005·Granted Sep 9, 2008·3 cites·21 claims
- 4458US7191374B2Method of and program product for performing gate-level diagnosis of failing vectorsLOGICVISION INC·Filed 2003·Granted Mar 13, 2007·9 cites·35 claims
- 4555US11789487B2Asynchronous interface for transporting test-related data via serial channelsSIEMENS IND SOFTWARE INC·Filed 2021·Granted Oct 17, 2023·0 cites·16 claims
- 4648US7257733B2Memory repair circuit and methodLOGICVISION INC·Filed 2004·Granted Aug 14, 2007·5 cites·18 claims
- 4746US12046315B2Memory built-in self-test with automated reference trim feedback for memory sensingSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jul 23, 2024·0 cites·11 claims
- 4843US2025157560A1Non-destructive memory self-testSIEMENS IND SOFTWARE INC·Filed 2022·Application pending·0 cites
- 4943US2010037109A1Method for at-speed testing of memory interface using scanLOGICVISION INC·Filed 2009·Application pending·0 cites
- 5041US12488852B2Read-only memory diagnosis and repairSIEMENS IND SOFTWARE INC·Filed 2021·Granted Dec 2, 2025·0 cites·19 claims
Showing the top 50 of 54 patent records by PatentIndex Score.
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