Inventor · disambiguated record
Jeremias D. Romero
Also filed as: ROMERO JEREMIAS D
9 granted patents·1 pending application·142 citations·filing 1991–2014
88Inventor score
Top patents by PatentIndex Score
10 records- 0194US6518167B1Method of forming a metal or metal nitride interface layer between silicon nitride and copperADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 11, 2003·81 cites·20 claims
- 0275US9728414B2Method of depositing copper using physical vapor depositionSPANSION LLC·Filed 2014·Granted Aug 8, 2017·3 cites·14 claims
- 0364US6992004B1Implanted barrier layer to improve line reliability and method of forming sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Jan 31, 2006·11 cites·29 claims
- 0462US8791018B2Method of depositing copper using physical vapor depositionYU WEN·Filed 2006·Granted Jul 29, 2014·2 cites·7 claims
- 0551US7169706B2Method of using an adhesion precursor layer for chemical vapor deposition (CVD) copper depositionADVANCED MICRO DEVICES INC·Filed 2003·Granted Jan 30, 2007·4 cites·20 claims
- 0650US5713667ATemperature sensing probe for microthermometryADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 3, 1998·21 cites·12 claims
- 0750US2014377949A1Method of depositing copper using physical vapor depositionSPANSION LLC·Filed 2014·Application pending·0 cites
- 0843US5290588ATiW barrier metal processADVANCED MICRO DEVICES INC·Filed 1991·Granted Mar 1, 1994·17 cites·14 claims
- 0936US6791081B1Method for determining pore characteristics in porous materialsADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 14, 2004·3 cites·12 claims
- 1026US5707484AMethod of accurate compositional analysis of dielectric films on semiconductorsADVANED MICRO DEVICES INC·Filed 1995·Granted Jan 13, 1998·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →