Inventor · disambiguated record
Heinz Mattes
Also filed as: MATTES HEINZ · MATTES HEINZ LUDWIG
20 granted patents·2 pending applications·1,436 citations·filing 1990–2016
94Inventor score
Top patents by PatentIndex Score
22 records- 0198US6038295AApparatus and method for recording, communicating and administering digital imagesSIEMENS AG·Filed 1997·Granted Mar 14, 2000·1.3k cites·26 claims
- 0290US7558991B2Device and method for measuring jitterINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jul 7, 2009·25 cites·34 claims
- 0383US7653170B2Electrical circuit for measuring times and method for measuring timesINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jan 26, 2010·15 cites·29 claims
- 0468US7471220B2Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuitINFINEON TECHNOLOGIES AG·Filed 2007·Granted Dec 30, 2008·5 cites·20 claims
- 0565US5224107AMethod in a parallel test apparatus for semiconductor memoriesSIEMENS AG·Filed 1990·Granted Jun 29, 1993·25 cites·12 claims
- 0656US7400995B2Device and method for testing integrated circuitsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 15, 2008·7 cites·18 claims
- 0755US5834955AIntegrated circuit with memory programmable pad driverSIEMENS AG·Filed 1996·Granted Nov 10, 1998·14 cites·13 claims
- 0854US7154809B2Method for measuring the delay time of a signal lineINFINEON TECHNOLOGIES AG·Filed 2004·Granted Dec 26, 2006·8 cites·11 claims
- 0953US7256602B2Electrical circuit and method for testing integrated circuitsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 14, 2007·6 cites·15 claims
- 1051US7945406B2Measuring device and method for measuring relative phase shifts of digital signalsINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 17, 2011·2 cites·25 claims
- 1150US7355414B2Test apparatus with low-reflection signal distributionINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 8, 2008·2 cites·24 claims
- 1247USRE47805EApparatus and method for the characterization of analog-to-digital convertersINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jan 7, 2020·0 cites·17 claims
- 1347US7391349B2Test apparatus and method for testing analog/digital convertersINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jun 24, 2008·2 cites·20 claims
- 1446US9088294B2Apparatus and method for the characterization of analog-to-digital convertersINFINEON TECHNOLOGIES AG·Filed 2014·Granted Jul 21, 2015·0 cites·17 claims
- 1546US8860592B2Signal generating circuitINFINEON TECHNOLOGIES AG·Filed 2013·Granted Oct 14, 2014·1 cites·7 claims
- 1646US7561639B2Method and device for estimating channel properties of a transmission channelINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 14, 2009·0 cites·20 claims
- 1743US8060800B2Evaluation circuit and method for detecting and/or locating faulty data words in a data stream TnGOESSEL MICHAEL·Filed 2004·Granted Nov 15, 2011·3 cites·23 claims
- 1843US7290022B2Method and filter arrangement for digital recursive filtering in the time domainINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 30, 2007·2 cites·24 claims
- 1938US7206712B2Test apparatus and test method for mixed-signal semiconductor componentsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 17, 2007·0 cites·23 claims
- 2036US2014098847A1Test circuitINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
- 2134US7720645B2Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 18, 2010·0 cites·9 claims
- 2234US2010079170A1Apparatus and method for the analysis of a periodic signalINFINEON TECHNOLOGIES AG·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →