Inventor · disambiguated record
Mine Nakagawa
Also filed as: NAKAGAWA MINE
4 granted patents·34 citations·filing 2004–2008
73Inventor score
Technology areasH01J
Top patents by PatentIndex Score
4 records- 0179US6963067B2Scanning electron microscope and sample observing method using itHITACHI SCIENCE SYSTEMS INC·Filed 2004·Granted Nov 8, 2005·20 cites·16 claims
- 0276US6963069B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 8, 2005·11 cites·20 claims
- 0374US7456403B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Nov 25, 2008·3 cites·2 claims
- 0459US7964845B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 21, 2011·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →