Inventor · disambiguated record
Jacob C. H. Phang
Also filed as: PHANG JACOB · PHANG JACOB C H · PHANG JACOB CHEE HONG
15 granted patents·227 citations·filing 1992–2011
93Inventor score
Files withUNIV SINGAPORE8SEMICAPS PTE LTD3CHUA CHOON MENG1INST MATERIALS RESEARCH & ENG1INST OF MATERIALS RESEARCH & E1
Top patents by PatentIndex Score
15 records- 0189US6320194B1Portable high resolution scanning electron microscope column using permanent magnet electron lensesINST MATERIALS RESEARCH & ENG·Filed 2000·Granted Nov 20, 2001·31 cites·8 claims
- 0285US6608305B1Selective deposition of a particle beam based on charging characteristics of a sampleUNIV SINGAPORE·Filed 2000·Granted Aug 19, 2003·33 cites·6 claims
- 0381US6057553APortable high resolution scanning electron microscope column using permanent magnet electron lensesINST OF MATERIALS RESEARCH & E·Filed 1998·Granted May 2, 2000·40 cites·8 claims
- 0476US5468967ADouble reflection cathodoluminescence detector with extremely high discrimination against backscattered electronsUNIV SINGAPORE·Filed 1994·Granted Nov 21, 1995·36 cites·14 claims
- 0575US6897664B1Laser beam induced phenomena detectionSEMICAPS PTE LTD·Filed 2002·Granted May 24, 2005·24 cites·22 claims
- 0672US5724131AIntegrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingUNIV SINGAPORE·Filed 1995·Granted Mar 3, 1998·29 cites·16 claims
- 0768US6911656B2Rotational stage for high speed, large area scanning in focused beam systemsUNIV SINGAPORE·Filed 2004·Granted Jun 28, 2005·5 cites·11 claims
- 0861US6777688B2Rotational stage for high speed, large area scanning in focused beam systemsUNIV SINGAPORE·Filed 2002·Granted Aug 17, 2004·3 cites·11 claims
- 0956US8891240B2Apparatus and method for cooling a semiconductor deviceCHUA CHOON MENG·Filed 2011·Granted Nov 18, 2014·1 cites·16 claims
- 1056US7623982B2Method of testing an electronic circuit and apparatus thereofSEMICAPS PTE LTD·Filed 2007·Granted Nov 24, 2009·2 cites·25 claims
- 1154USRE43757ERotational stage for high speed, large area scanning in focused beam systemsLIU YONG YU·Filed 2007·Granted Oct 23, 2012·0 cites·21 claims
- 1254US5264704AHigh efficiency cathodoluminescence detector with high discrimination against backscattered electronsUNIV SINGAPORE·Filed 1992·Granted Nov 23, 1993·11 cites·15 claims
- 1338US5486769AMethod and apparatus for measuring quantitative voltage contrastUNIV SINGAPORE·Filed 1994·Granted Jan 23, 1996·10 cites·17 claims
- 1437US7456032B2Method and system for measuring laser induced phenomena changes in a semiconductor deviceSEMICAPS PTE LTD·Filed 2005·Granted Nov 25, 2008·0 cites·12 claims
- 1536US6556029B1Pulsed single contact optical beam induced current analysis of integrated circuitsUNIV SINGAPORE·Filed 2000·Granted Apr 29, 2003·2 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →