Inventor · disambiguated record
Akinori Sekiyama
Also filed as: SEKIYAMA AKINORI
3 granted patents·27 citations·filing 1996–2005
64Inventor score
Top patents by PatentIndex Score
3 records- 0161US8080873B2Semiconductor device, semiconductor package, and method for testing semiconductor deviceTANAKA HIROYUKI·Filed 2005·Granted Dec 20, 2011·2 cites·14 claims
- 0259US5745426AMemory card and circuit board used thereforFUJITSU LTD·Filed 1996·Granted Apr 28, 1998·25 cites·12 claims
- 0337US6909172B2Semiconductor device with conduction test terminalsFUJITSU LTD·Filed 2003·Granted Jun 21, 2005·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →