Inventor · disambiguated record
Timothy J. Von Reyn
Also filed as: VON REYN TIMOTHY J
3 granted patents·120 citations·filing 2000–2002
73Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0192US6643807B1Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing testIBM·Filed 2000·Granted Nov 4, 2003·89 cites·22 claims
- 0278US7308621B2Testing of ECC memoriesIBM·Filed 2002·Granted Dec 11, 2007·28 cites·19 claims
- 0352US7149941B2Optimized ECC/redundancy fault recoveryIBM·Filed 2002·Granted Dec 12, 2006·3 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →