Inventor · disambiguated record
Keiichiro Mori
Also filed as: MORI KEIICHIRO
10 granted patents·3 pending applications·82 citations·filing 1987–2022
84Inventor score
Top patents by PatentIndex Score
13 records- 0188US10422756B2Semiconductor wafer evaluation method and semiconductor waferSUMCO CORP·Filed 2016·Granted Sep 24, 2019·4 cites·6 claims
- 0286US9633913B2Method of evaluating epitaxial waferSUMCO CORP·Filed 2016·Granted Apr 25, 2017·6 cites·16 claims
- 0385US10718720B2Semiconductor wafer evaluation method and semiconductor waferSUMCO CORP·Filed 2019·Granted Jul 21, 2020·2 cites·6 claims
- 0484US4845972AMethod for working the ends of steel pipe by upsetting and pressingNIPPON STEEL CORP·Filed 1987·Granted Jul 11, 1989·66 cites·17 claims
- 0574US9553004B2Cleaning methodTAKEMURA MAKOTO·Filed 2010·Granted Jan 24, 2017·4 cites·7 claims
- 0649US2024230553A1Method of evaluating silicon single-crystal ingot, method of evaluating silicon epitaxial wafer, method of manufacturing silicon epitaxial wafer, and method of evaluating silicon mirror polished waferSUMCO CORP·Filed 2022·Application pending·0 cites
- 0747US8773669B2Optical deviceTOSHIBA KK·Filed 2013·Granted Jul 8, 2014·0 cites·20 claims
- 0845US2015035800A1Information terminal apparatusTOSHIBA KK·Filed 2014·Application pending·0 cites
- 0945US2015035763A1Information terminal apparatusTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1043US11948819B2Method of evaluating silicon wafer, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, and silicon waferSUMCO CORP·Filed 2017·Granted Apr 2, 2024·0 cites·6 claims
- 1142US12188880B2Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor waferSUMCO CORP·Filed 2020·Granted Jan 7, 2025·0 cites·5 claims
- 1237US12247927B2Method of evaluating semiconductor waferSUMCO CORP·Filed 2021·Granted Mar 11, 2025·0 cites·4 claims
- 1336US10895538B2Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probeSUMCO CORP·Filed 2017·Granted Jan 19, 2021·0 cites·15 claims
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