Inventor · disambiguated record
Lior Yaron
Also filed as: YARON LIOR
4 granted patents·4 pending applications·3 citations·filing 2020–2024
59Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD8
Top patents by PatentIndex Score
8 records- 0188US11662324B1Three-dimensional surface metrology of wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 30, 2023·2 cites·20 claims
- 0279US11264202B2Generating three dimensional information regarding structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0362US2025341481A1Non-destructive surface metrology of patterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0460US2025095955A1Method and system for calibration of diffraction anglesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0558US12456600B2Scanning electron microscopy-based tomography of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 0655US2025391114A1Algorithm for 3d reconstruction of diagonally cut semiconductor logic structureAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0754US2025216346A1Determination of layer properties using widening of an electron beamAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0844US11921063B2Lateral recess measurement in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →