Inventor · disambiguated record
Mari Shibayama
Also filed as: SHIBAYAMA MARI
4 granted patents·74 citations·filing 1998–2002
78Inventor score
Top patents by PatentIndex Score
4 records- 0182US6853177B2Semiconductor device with process monitor circuit and test method thereofRENESAS TECH CORP·Filed 2002·Granted Feb 8, 2005·33 cites·17 claims
- 0263US6311300B1Semiconductor testing apparatus for testing semiconductor device including built in self test circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 30, 2001·22 cites·7 claims
- 0361US6584592B2Semiconductor testing apparatus for testing semiconductor device including built in self test circuitRYODEN SEMICONDUCTOR SYST ENG·Filed 2001·Granted Jun 24, 2003·9 cites·8 claims
- 0452US6708302B1Semiconductor moduleRENESAS TECH CORP·Filed 2000·Granted Mar 16, 2004·10 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Mari Shibayama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →