Inventor · disambiguated record
Nihal Wijeyesekera
Also filed as: WIJEYESEKERA NIHAL · WIJEYESEKERA NIHAL I · WIJEYESEKERA NIHAL IAN
5 granted patents·185 citations·filing 1997–2002
84Inventor score
Technology areasG01V
Files withSCHLUMBERGER TECHNOLOGY CORP5
Top patents by PatentIndex Score
5 records- 0179US6944548B2Formation evaluation through azimuthal measurementsSCHLUMBERGER TECHNOLOGY CORP·Filed 2002·Granted Sep 13, 2005·44 cites·23 claims
- 0271US5912460AMethod for determining formation density and formation photo-electric factor with a multi-detector-gamma-ray toolSCHLUMBERGER TECHNOLOGY CORP·Filed 1997·Granted Jun 15, 1999·53 cites·26 claims
- 0363US6032102AMethod and apparatus for measuring well characteristics and formation propertiesSCHLUMBERGER TECHNOLOGY CORP·Filed 1998·Granted Feb 29, 2000·41 cites·26 claims
- 0461US5841135AMethod and apparatus for measuring formation density and the formation photo-electric factor with a multi-detector gamma-gamma toolSCHLUMBERGER TECHNOLOGY CORP·Filed 1997·Granted Nov 24, 1998·37 cites·23 claims
- 0548US6776035B2Method and device for calibration of dual-axis tilt meterSCHLUMBERGER TECHNOLOGY CORP·Filed 2002·Granted Aug 17, 2004·10 cites·23 claims
Join the waitlist — get patent alerts
Get an alert when Nihal Wijeyesekera files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →