Inventor · disambiguated record
Alberto Diaspro
Also filed as: DIASPRO ALBERTO
6 granted patents·4 pending applications·11 citations·filing 2012–2022
74Inventor score
Files withFONDAZIONE ST ITALIANO TECNOLOGIA6FOND ST ITALIANO TECNOLOGIA2DIFATO FRANCESCO1FOND ISTITUTO ITALIANO DI TECNOLOGIA1
Top patents by PatentIndex Score
10 records- 0180US11092793B2Method of lightening at least one biological sample, three-dimensional high resolution depletion microscopy method and corresponding microscopeFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2018·Granted Aug 17, 2021·2 cites·20 claims
- 0277US9772285B2Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emissionFOND ST ITALIANO TECNOLOGIA·Filed 2014·Granted Sep 26, 2017·4 cites·6 claims
- 0368US10775602B2Microscopy method and apparatus for optical tracking of emitter objectsFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2018·Granted Sep 15, 2020·3 cites·17 claims
- 0460US11422348B2Time-resolved imaging method with high spatial resolutionFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2019·Granted Aug 23, 2022·1 cites·9 claims
- 0558US9810966B2Random access stimulated emission depletion (STED) microscopyFOND ST ITALIANO TECNOLOGIA·Filed 2014·Granted Nov 7, 2017·1 cites·8 claims
- 0651US2019262239A1Combined material including anodic porous alumina and a polymer matrix, and its use for the dental reconditionFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2019·Application pending·0 cites
- 0747US2015250686A1Combined material including anodic porous alumina and a polymer matrix, and its use for the dental reconditionFOND ISTITUTO ITALIANO DI TECNOLOGIA·Filed 2013·Application pending·0 cites
- 0845US2024295498A1Simultaneous multi-species super-resolution imaging via temporal multiplexing and single- photon detector arrayFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2022·Application pending·0 cites
- 0941US11372224B2Method of stimulated emission depletion microscopy having high spatial resolutionFONDAZIONE ST ITALIANO TECNOLOGIA·Filed 2018·Granted Jun 28, 2022·0 cites·12 claims
- 1025US2015106979A1Optical and atomic force microscopy integrated system for multi-probe spectroscopy measurements applied in a wide spatial region with an extended range of force sensitivityDIFATO FRANCESCO·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →