Inventor · disambiguated record
Ciaran J. O'Connor
Also filed as: O'CONNOR CIARAN · O'CONNOR CIARAN J · O'CONNOR CIARAN JOHN PATRICK
14 granted patents·2 pending applications·53 citations·filing 2009–2023
89Inventor score
Files withELEMENTAL SCIENT LASERS LLC8ELECTRO SCIENT IND INC2ELEMENTAL SCIENTIFIC INC2O'CONNOR CIARAN JOHN PATRICK2HALDERMAN JONATHAN D1
Top patents by PatentIndex Score
16 records- 0191US9524856B2In-chamber fluid handling system and methods handling fluids using the sameELECTRO SCIENT IND INC·Filed 2014·Granted Dec 20, 2016·12 cites·29 claims
- 0291US8879064B2Apparatus and method for transporting an aerosolO'CONNOR CIARAN JOHN PATRICK·Filed 2011·Granted Nov 4, 2014·21 cites·26 claims
- 0390US11367604B2User exchangeable ablation cell interface to alter LA-ICP-MS peak widthsELEMENTAL SCIENT LASERS LLC·Filed 2021·Granted Jun 21, 2022·2 cites·20 claims
- 0490US11092519B1System and method for automated sampling and analysisELEMENTAL SCIENT LASERS LLC·Filed 2018·Granted Aug 17, 2021·5 cites·20 claims
- 0587US11195708B2Humidification of laser ablated sample for analysisELEMENTAL SCIENTIFIC INC·Filed 2020·Granted Dec 7, 2021·2 cites·18 claims
- 0683US8598488B2Method and apparatus for adjusting radiation spot sizeO'CONNOR CIARAN JOHN PATRICK·Filed 2011·Granted Dec 3, 2013·9 cites·23 claims
- 0782US12436107B1Laser ablation system with in-chamber fiber optic detection for laser induced breakdown spectroscopyELEMENTAL SCIENT LASERS LLC·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
- 0878US12280444B2Simultaneous pattern-scan placement during sample processingELEMENTAL SCIENT LASERS LLC·Filed 2023·Granted Apr 22, 2025·0 cites·14 claims
- 0974US11837454B2User exchangeable ablation cell interface to alter LA-ICP-MS peak widthsELEMENTAL SCIENT LASERS LLC·Filed 2022·Granted Dec 5, 2023·0 cites·14 claims
- 1071US11686653B1System and method for automated sampling and analysisELEMENTAL SCIENT LASERS LLC·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 1170US11756777B2Humidification of laser ablated sample for analysisELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Sep 12, 2023·0 cites·18 claims
- 1265US9157876B2Method and apparatus for characterizing objects and monitoring manufacturing processesHALDERMAN JONATHAN D·Filed 2012·Granted Oct 13, 2015·2 cites·24 claims
- 1354US11183378B2Apparatus and method to bypass a sample chamber in laser assisted spectroscopyELEMENTAL SCIENT LASERS LLC·Filed 2019·Granted Nov 23, 2021·0 cites·21 claims
- 1453US11850677B2Simultaneous pattern-scan placement during sample processingELEMENTAL SCIENT LASERS LLC·Filed 2017·Granted Dec 26, 2023·0 cites·6 claims
- 1549US2010207038A1Apparatus and method for laser irradiationUNIV LOUGHBOROUGH·Filed 2009·Application pending·0 cites
- 1648US2014268134A1Laser sampling methods for reducing thermal effectsELECTRO SCIENT IND INC·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →