Inventor · disambiguated record

Nerinder Singh

Also filed as: SINGH NERINDER

1 granted patent·1 pending application·1 citations·filing 2012–2013

16Inventor score

Technology areasG01R H10P

Files withNVIDIA CORP2

Top patents by PatentIndex Score

2 records

0155US9007079B2System and method for compensating measured IDDQ valuesNVIDIA CORP·Filed 2012·Granted Apr 14, 2015·1 cites·20 claims
0230US2014214342A1Verification of test program stability and wafer fabrication process sensitivityNVIDIA CORP·Filed 2013·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →