Inventor · disambiguated record
Siddhartha Panda
Also filed as: PANDA SIDDHARTHA · PANDA SIDDHARTHA K · PANDA SIDDHARTHA KUMAR
39 granted patents·18 pending applications·654 citations·filing 1994–2022
97Inventor score
Top patents by PatentIndex Score
57 records- 0196US7176481B2In situ doped embedded sige extension and source/drain for enhanced PFET performanceIBM·Filed 2005·Granted Feb 13, 2007·52 cites·28 claims
- 0295US7288482B2Silicon nitride etching methodsIBM·Filed 2005·Granted Oct 30, 2007·260 cites·18 claims
- 0391US8783948B2Flexible temperature sensor and sensor arrayPANDA SIDDHARTHA·Filed 2010·Granted Jul 22, 2014·46 cites·23 claims
- 0491US7709317B2Method to increase strain enhancement with spacerless FET and dual liner processIBM·Filed 2005·Granted May 4, 2010·15 cites·12 claims
- 0591US7442618B2Method to engineer etch profiles in Si substrate for advanced semiconductor devicesCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Oct 28, 2008·22 cites·21 claims
- 0689US7525161B2Strained MOS devices using source/drain epitaxyIBM·Filed 2007·Granted Apr 28, 2009·17 cites·9 claims
- 0789US7135724B2Structure and method for making strained channel field effect transistor using sacrificial spacerIBM·Filed 2004·Granted Nov 14, 2006·47 cites·16 claims
- 0887US6743727B2Method of etching high aspect ratio openingsIBM·Filed 2001·Granted Jun 1, 2004·38 cites·20 claims
- 0984US7977185B2Method and apparatus for post silicide spacer removalIBM·Filed 2005·Granted Jul 12, 2011·9 cites·14 claims
- 1084US5525320AProcess for aluminum nitride powder productionUNIV CINCINNATI·Filed 1994·Granted Jun 11, 1996·45 cites·23 claims
- 1182US7459382B2Field effect device with reduced thickness gateIBM·Filed 2006·Granted Dec 2, 2008·9 cites·1 claims
- 1279US7645656B2Structure and method for making strained channel field effect transistor using sacrificial spacerIBM·Filed 2006·Granted Jan 12, 2010·7 cites·18 claims
- 1379US7087532B2Formation of controlled sublithographic structuresIBM·Filed 2004·Granted Aug 8, 2006·22 cites·20 claims
- 1477US10719439B2Garbage collection of a storage deviceSEAGATE TECHNOLOGY LLC·Filed 2017·Granted Jul 21, 2020·2 cites·17 claims
- 1577US7393746B2Post-silicide spacer removalIBM·Filed 2006·Granted Jul 1, 2008·6 cites·6 claims
- 1676US7405436B2Stressed field effect transistors on hybrid orientation substrateIBM·Filed 2005·Granted Jul 29, 2008·6 cites·9 claims
- 1774US7754615B2Method and apparatus for detecting endpoint in a dry etching system by monitoring a superimposed DC currentTOKYO ELECTRON LTD·Filed 2006·Granted Jul 13, 2010·4 cites·12 claims
- 1873US7687829B2Stressed field effect transistors on hybrid orientation substrateIBM·Filed 2008·Granted Mar 30, 2010·4 cites·17 claims
- 1967US8892811B2Reducing write amplification in a flash memoryISH MARK·Filed 2012·Granted Nov 18, 2014·2 cites·20 claims
- 2066US9274713B2Device driver, method and computer-readable medium for dynamically configuring a storage controller based on RAID type, data alignment with a characteristic of storage elements and queue depth in a cacheLSI CORP·Filed 2014·Granted Mar 1, 2016·2 cites·20 claims
- 2165US10534541B2Asynchronous discovery of initiators and targets in a storage fabricSEAGATE TECHNOLOGY LLC·Filed 2017·Granted Jan 14, 2020·1 cites·20 claims
- 2263US6709917B2Method to increase the etch rate and depth in high aspect ratio structureIBM·Filed 2002·Granted Mar 23, 2004·8 cites·18 claims
- 2361US8799631B2Dynamically select operating system (OS) to boot based on hardware statesBATWARA ASHISH·Filed 2010·Granted Aug 5, 2014·2 cites·6 claims
- 2461US7863197B2Method of forming a cross-section hourglass shaped channel region for charge carrier mobility modificationIBM·Filed 2006·Granted Jan 4, 2011·2 cites·9 claims
- 2561US7776695B2Semiconductor device structure having low and high performance devices of same conductive type on same substrateIBM·Filed 2006·Granted Aug 17, 2010·2 cites·17 claims
- 2661US6706586B1Method of trench sidewall enhancementIBM·Filed 2002·Granted Mar 16, 2004·9 cites·20 claims
- 2757US7344991B2Method and apparatus for multilayer photoresist dry developmentTOKYO ELECTRON LTD·Filed 2003·Granted Mar 18, 2008·6 cites·7 claims
- 2855US6806200B2Method of improving etch uniformity in deep silicon etchingIBM·Filed 2002·Granted Oct 19, 2004·4 cites·8 claims
- 2954US8048325B2Method and apparatus for multilayer photoresist dry developmentTOKYO ELECTRON LTD·Filed 2008·Granted Nov 1, 2011·1 cites·7 claims
- 3054US7186660B2Silicon precursors for deep trench silicon etch processesIBM·Filed 2003·Granted Mar 6, 2007·4 cites·14 claims
- 3153US2005244933A1Method and apparatus for precise temperature cycling in chemical/biochemical processesIBM·Filed 2004·Application pending·0 cites
- 3253US2006154280A1Method and apparatus for precise temperature cycling in chemical/biochemical processesIBM·Filed 2006·Application pending·0 cites
- 3351US7438822B2Apparatus and method for shielding a wafer from charged particles during plasma etchingIBM·Filed 2005·Granted Oct 21, 2008·0 cites·8 claims
- 3451US2008118955A1Method for precise temperature cycling in chemical / biochemical processesIBM·Filed 2007·Application pending·0 cites
- 3550US7278300B2Gas filled reactive atomic force microscope probeIBM·Filed 2005·Granted Oct 9, 2007·0 cites·20 claims
- 3649US11106361B2Technologies for lockless, scalable, and adaptive storage quality of serviceINTEL CORP·Filed 2019·Granted Aug 31, 2021·0 cites·25 claims
- 3749US2014328373A1Flexible temperature sensor and sensor arrayINDIAN INST TECHNOLOGY KANPUR·Filed 2014·Application pending·0 cites
- 3847US7256399B2Non-destructive in-situ elemental profilingIBM·Filed 2005·Granted Aug 14, 2007·0 cites·18 claims
- 3946US10310975B2Cache offload based on predictive power parameterSEAGATE TECHNOLOGY LLC·Filed 2016·Granted Jun 4, 2019·0 cites·19 claims
- 4046US2010187636A1Method to increase strain enhancement with spacerless fet and dual liner processIBM·Filed 2010·Application pending·0 cites
- 4146US2009104776A1Methods for forming nested and isolated lines in semiconductor devicesIBM·Filed 2007·Application pending·0 cites
- 4245US8492803B2Field effect device with reduced thickness gateAMOS RICKY S·Filed 2008·Granted Jul 23, 2013·0 cites·16 claims
- 4343US2014258595A1System, method and computer-readable medium for dynamic cache sharing in a flash-based caching solution supporting virtual machinesLSI CORP·Filed 2013·Application pending·0 cites
- 4442US2007293016A1Semiconductor structure including isolation region with variable linewidth and method for fabrication therofIBM·Filed 2006·Application pending·0 cites
- 4542US2007048980A1Method for post-rie passivation of semiconductor surfaces for epitaxial growthIBM·Filed 2005·Application pending·0 cites
- 4641US7285775B2Endpoint detection for the patterning of layered materialsIBM·Filed 2004·Granted Oct 23, 2007·0 cites·19 claims
- 4741US2008078743A1Elevated temperature chemical oxide removal module and processMUNOZ ANDRES F·Filed 2006·Application pending·0 cites
- 4841US2008173942A1STRUCTURE AND METHOD OF MANUFACTURING A STRAINED FinFET WITH STRESSED SILICIDEIBM·Filed 2007·Application pending·0 cites
- 4941US2004110388A1Apparatus and method for shielding a wafer from charged particles during plasma etchingIBM·Filed 2002·Application pending·0 cites
- 5040US7645356B2Method of processing wafers with resonant heatingIBM·Filed 2003·Granted Jan 12, 2010·0 cites·11 claims
Showing the top 50 of 57 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →