Inventor · disambiguated record
Zaifu Zhang
Also filed as: ZHANG ZAIFU
3 granted patents·43 citations·filing 1998–2007
67Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0171US7941718B2Electronic device testing systemFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted May 10, 2011·7 cites·16 claims
- 0271US6170078B1Fault simulation using dynamically alterable behavioral modelsIBM·Filed 1998·Granted Jan 2, 2001·36 cites·21 claims
- 0329US7865759B2Programmable clock control architecture for at-speed testingBROADCOM CORP·Filed 2007·Granted Jan 4, 2011·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →