Inventor · disambiguated record
Yin-Ping Chern
Also filed as: CHERN YIN-PING
1 granted patent·2 pending applications·2 citations·filing 2019–2021
18Inventor score
Files withREALTEK SEMICONDUCTOR CORP3
Top patents by PatentIndex Score
3 records- 0175US11073558B2Circuit having multiple scan modes for testingREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jul 27, 2021·2 cites·9 claims
- 0248US2021287086A1Wafer testing machine and method for training artificial intelligence model to test waferREALTEK SEMICONDUCTOR CORP·Filed 2021·Application pending·0 cites
- 0338US2021132147A1Test pattern generating method, test pattern generating device and fault model generating methodREALTEK SEMICONDUCTOR CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →