Inventor · disambiguated record

Pui L. Yee

Also filed as: YEE PUI L · YEE PUI LING

2 granted patents·4 citations·filing 2012–2013

46Inventor score

Technology areasH01H H10P

Files withCHEN FEN1 IBM1

Top patents by PatentIndex Score

2 records

0171US9013202B2Testing structure and method of using the testing structureCHEN FEN·Filed 2012·Granted Apr 21, 2015·3 cites·17 claims
0261US9496110B2Micro-electro-mechanical system (MEMS) structure and design structuresIBM·Filed 2013·Granted Nov 15, 2016·1 cites·19 claims

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Pui L. Yee — Patent Inventor | PatentIndex