Inventor · disambiguated record
Kenneth E. Posse
Also filed as: POSSE KENNETH E
10 granted patents·204 citations·filing 1989–1999
91Inventor score
Top patents by PatentIndex Score
10 records- 0181US5513188AEnhanced interconnect testing through utilization of board topology dataHEWLETT PACKARD CO·Filed 1994·Granted Apr 30, 1996·46 cites·20 claims
- 0268US5260947ABoundary-scan test method and apparatus for diagnosing faults in a device under testHEWLETT PACKARD CO·Filed 1990·Granted Nov 9, 1993·29 cites·24 claims
- 0367US5544175AMethod and apparatus for the capturing and characterization of high-speed digital informationHEWLETT PACKARD CO·Filed 1994·Granted Aug 6, 1996·28 cites·20 claims
- 0463US5510704APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1995·Granted Apr 23, 1996·22 cites·10 claims
- 0562US5260649APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1992·Granted Nov 9, 1993·19 cites·24 claims
- 0650US5448166APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1993·Granted Sep 5, 1995·12 cites·8 claims
- 0749US5001418AMethod for compressing data-vectors for a circuit board testing machinePOSSE KENNETH E·Filed 1989·Granted Mar 19, 1991·24 cites·6 claims
- 0844US5237221AOn-chip pull-up circuit which may be selectively disabledHEWLETT PACKARD CO·Filed 1991·Granted Aug 17, 1993·7 cites·11 claims
- 0942US5387862APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1993·Granted Feb 7, 1995·8 cites·8 claims
- 1034US6311301B1System for efficient utilization of multiple test systemsFiled 1999·Granted Oct 30, 2001·9 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →