Inventor · disambiguated record
Yariv Simovitch
Also filed as: SIMOVITCH YARIV
3 granted patents·2 pending applications·0 citations·filing 2017–2023
39Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5
Top patents by PatentIndex Score
5 records- 0160US2025189435A1Acoustic resonance-based metrology of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0259US2025155235A1Depth profiling of semiconductor structures using multi-wavelength pump-probe techniqueAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0352US11803961B2Die-to-multi-die wafer inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Oct 31, 2023·0 cites·20 claims
- 0447US11644426B2Methods and systems for generating calibration data for wafer analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 9, 2023·0 cites·20 claims
- 0534US11029253B2Computerized method for configuring an inspection system, computer program product and an inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 8, 2021·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →