Inventor · disambiguated record
Ikuyoshi Nakatani
Also filed as: NAKATANI IKUYOSHI
7 granted patents·1 pending application·181 citations·filing 1987–2011
86Inventor score
Top patents by PatentIndex Score
8 records- 0184US5233291AMethod of and apparatus for measuring electric characteristics of semiconductor waferDAINIPPON SCREEN MFG·Filed 1991·Granted Aug 3, 1993·59 cites·27 claims
- 0270US4803948AHeat processing apparatus for semiconductor manufacturingDAINIPPON SCREEN MFG·Filed 1987·Granted Feb 14, 1989·38 cites·5 claims
- 0369US5239183AOptical gap measuring device using frustrated internal reflectionDAINIPPON SCREEN MFG·Filed 1992·Granted Aug 24, 1993·28 cites·14 claims
- 0465US5225690AGap measuring device and method using frustrated internal reflectionDAINIPPON SCREEN MFG·Filed 1991·Granted Jul 6, 1993·25 cites·58 claims
- 0558US5568252AMethod and apparatus for measuring insulation film thickness of semiconductor waferDAINIPPON SCREEN MFG·Filed 1994·Granted Oct 22, 1996·30 cites·12 claims
- 0651US8536024B2Processing method for a workpiece, dividing method for a workpiece, and laser processing apparatusNAGATOMO SHOHEI·Filed 2010·Granted Sep 17, 2013·1 cites·17 claims
- 0730US8899459B2Breaking apparatus and breaking method for substrate made of brittle materialKONDO NORIYUKI·Filed 2011·Granted Dec 2, 2014·0 cites·7 claims
- 0826US2011100966A1Laser processing method, method for dividing workpiece, and laser processing apparatusNAGATOMO SHOHEI·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ikuyoshi Nakatani files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →