Inventor · disambiguated record
Chul-Oh Yoon
Also filed as: YOON CHUL OH
5 granted patents·395 citations·filing 1998–2002
86Inventor score
Technology areasG01R
Top patents by PatentIndex Score
5 records- 0197US6160382AMethod and apparatus for determining Characteristic parameters of a charge storage deviceKOREA KUMHO PETROCHEM CO LTD·Filed 1999·Granted Dec 12, 2000·201 cites·38 claims
- 0289US6118275AMethod and apparatus for measuring battery capacity using voltage response signal based on pulse currentKOREA KUMHO PETROCHEM CO LTD·Filed 1998·Granted Sep 12, 2000·80 cites·8 claims
- 0385US6208147B1Method of and apparatus for measuring battery capacity by impedance spectrum analysisKOREA KUMHO PETROCHENICAL CO L·Filed 1999·Granted Mar 27, 2001·69 cites·11 claims
- 0475US6687631B2Laplace transform impedance spectrometer and its measurement methodKOREA KUMHO PETROCHEM CO LTD·Filed 2002·Granted Feb 3, 2004·16 cites·3 claims
- 0572US6502046B1Laplace transform impedance spectrometer and its measurement methodKOREA KUMHO PETROCHEM CO LTD·Filed 1999·Granted Dec 31, 2002·29 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →