Inventor · disambiguated record
Adolphus E. Mcclanahan
Also filed as: MCCLANAHAN ADOLPHUS E · McCLANAHAN ADOLPHUS EDWARD
7 granted patents·3 pending applications·174 citations·filing 1993–2021
85Inventor score
Top patents by PatentIndex Score
10 records- 0191US7068056B1System and method for the probing of a waferTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 27, 2006·42 cites·20 claims
- 0284US5513594AClamp with wafer release for semiconductor wafer processing equipmentFiled 1993·Granted May 7, 1996·90 cites·11 claims
- 0373US7495458B2Probe card and temperature stabilizer for testing semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2006·Granted Feb 24, 2009·8 cites·12 claims
- 0469US10732218B2Seal monitor for probe or test chamberTEXAS INSTRUMENTS INC·Filed 2015·Granted Aug 4, 2020·2 cites·12 claims
- 0567US5605866AClamp with wafer release for semiconductor wafer processing equipmentVARIAN ASSOCIATES·Filed 1995·Granted Feb 25, 1997·30 cites·4 claims
- 0658US12343880B2End effector bump detectorTEXAS INSTRUMENTS INC·Filed 2021·Granted Jul 1, 2025·0 cites·17 claims
- 0742US2017173793A1End effector bump detectorTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
- 0840US6846095B2Lighted cassette alignment fixtureTEXAS INSTRUMENTS INC·Filed 2002·Granted Jan 25, 2005·2 cites·15 claims
- 0940US2009115441A1Probe card and temperature stabilizer for testing semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2009·Application pending·0 cites
- 1031US2006071679A1System and method for the probing of a waferTEXAS INSTRUMENTS INC·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →