Inventor · disambiguated record
Yuushin Kimura
Also filed as: KIMURA YUUSHIN
2 granted patents·6 citations·filing 2006–2010
51Inventor score
Top patents by PatentIndex Score
2 records- 0172US8736295B2Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing methodWATANABE YUICHI·Filed 2010·Granted May 27, 2014·4 cites·9 claims
- 0257US7355421B2Semiconductor apparatus testing arrangement and semiconductor apparatus testing methodFUJITSU LTD·Filed 2006·Granted Apr 8, 2008·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →