Inventor · disambiguated record
Shengcheng Jin
Also filed as: JIN SHENGCHENG
1 granted patent·5 pending applications·2 citations·filing 2018–2023
18Inventor score
Files withASML NETHERLANDS BV6
Top patents by PatentIndex Score
6 records- 0168US11238579B2Defect pattern grouping method and systemASML NETHERLANDS BV·Filed 2018·Granted Feb 1, 2022·2 cites·18 claims
- 0249US2025265701A1Transient defect inspection using an inspection imageASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0348US2025166166A1Systems and methods for defect location binning in charged-particle systemsASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0447US2023139085A1Processing reference data for wafer inspectionASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 0545US2025005739A1Systems and methods for defect detection and defect location identification in a charged particle systemASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0638US2024212317A1Hierarchical clustering of fourier transform based layout patternsASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →