Inventor · disambiguated record
Kenneth M. Butler
Also filed as: BUTLER KENNETH · BUTLER KENNETH M · BUTLER KENNETH MICHAEL
14 granted patents·2 pending applications·169 citations·filing 1996–2021
91Inventor score
Top patents by PatentIndex Score
16 records- 0193US8344749B2Through carrier dual side loop-back testing of TSV die after die attach to substrateTEXAS INSTRUMENTS INC·Filed 2010·Granted Jan 1, 2013·23 cites·22 claims
- 0283US9899332B2Visual identification of semiconductor diesTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 20, 2018·5 cites·20 claims
- 0379US5694402ASystem and method for structurally testing integrated circuit devicesTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 2, 1997·94 cites·20 claims
- 0477US7494829B2Identification of outlier semiconductor devices using data-driven statistical characterizationTEXAS INSTRUMENTS INC·Filed 2007·Granted Feb 24, 2009·10 cites·8 claims
- 0575US8051398B2Test method and system for characterizing and/or refining an IC design cycleTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 1, 2011·7 cites·18 claims
- 0666US10431551B2Visual identification of semiconductor diesTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 1, 2019·1 cites·20 claims
- 0765US7129735B2Method for test data-driven statistical detection of outlier semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 31, 2006·12 cites·9 claims
- 0859US7839155B2Methods and apparatus to analyze on-chip controlled integrated circuitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Nov 23, 2010·3 cites·19 claims
- 0959US6697982B2Generating netlist test vectors by stripping references to a pseudo inputTEXAS INSTRUMENTS INC·Filed 2001·Granted Feb 24, 2004·8 cites·2 claims
- 1058US8126681B2Semiconductor outlier identification using serially-combined data transform processing methodologiesNAHAR AMIT V·Filed 2009·Granted Feb 28, 2012·4 cites·19 claims
- 1157US12007428B2Systems and methods for multidimensional dynamic part average testingADVANTEST CORP·Filed 2021·Granted Jun 11, 2024·0 cites·20 claims
- 1250US7865849B2System and method for estimating test escapes in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jan 4, 2011·2 cites·18 claims
- 1347US10101386B2Real time semiconductor process excursion monitorTEXAS INSTRUMENTS INC·Filed 2014·Granted Oct 16, 2018·0 cites·27 claims
- 1441US2007288797A1Generating scan test vectors for proprietary cores using pseudo pinsTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 1536US7203880B2Generating an abbreviated netlist including pseudopin inputs and output nodesTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 10, 2007·0 cites·2 claims
- 1630US2016351508A1Creating Unique Device Identification For Semiconductor DevicesTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →