Inventor · disambiguated record
Kyeong-Mi Lee
Also filed as: LEE KYEONG MI
3 granted patents·2 citations·filing 2016–2017
51Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0165US10352964B2Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 16, 2019·1 cites·14 claims
- 0260US10101660B2Methods of forming patterns of semiconductor devicesPARK JEONG JU·Filed 2016·Granted Oct 16, 2018·1 cites·15 claims
- 0334US9892918B2Method of forming pattern of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 13, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →