Inventor · disambiguated record
Koichi Higashide
Also filed as: HIGASHIDE KOICHI
2 granted patents·1 pending application·99 citations·filing 2001–2003
62Inventor score
Technology areasG01R
Files withADVANTEST CORP2
Top patents by PatentIndex Score
3 records- 0189US6556934B2Timing calibration method and semiconductor device testing apparatus having timing calibration functionADVANTEST CORP·Filed 2001·Granted Apr 29, 2003·97 cites·4 claims
- 0239US6828799B2Propagation delay time measuring method and testing apparatusADVANTEST CORP·Filed 2003·Granted Dec 7, 2004·2 cites·8 claims
- 0328US2003125897A1Semiconductor device testing apparatus having timing calibration functionFiled 2003·Application pending·0 cites
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