Inventor · disambiguated record
Anderson Chou
Also filed as: CHOU ANDERSON
1 granted patent·5 pending applications·0 citations·filing 2024–2025
13Inventor score
Files withKLA CORP6
Top patents by PatentIndex Score
6 records- 0174US12480893B2Optical and X-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·39 claims
- 0268US2025237619A1Optical and x-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2025·Application pending·0 cites
- 0359US2025146893A1Transistor channel stress and mobility metrology using multipass spectroscopic ellipsometry and raman joint measurementKLA CORP·Filed 2024·Application pending·0 cites
- 0458US2025224344A1Measurements Of Semiconductor Structures Based On Data Collected At Prior Process StepsKLA CORP·Filed 2024·Application pending·0 cites
- 0558US2025123225A1Spectra delta metrologyKLA CORP·Filed 2024·Application pending·0 cites
- 0656US2025012734A1Multiple Pass Optical Measurements Of Semiconductor StructuresKLA CORP·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Anderson Chou files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →