Inventor · disambiguated record
Hisaki Kozaki
Also filed as: KOZAKI HISAKI
2 granted patents·116 citations·filing 2007–2009
69Inventor score
Technology areasH10P
Files withTOSHIBA KK2
Top patents by PatentIndex Score
2 records- 0195US7973281B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2009·Granted Jul 5, 2011·57 cites·18 claims
- 0295US7573066B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2007·Granted Aug 11, 2009·59 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →