Inventor · disambiguated record
Tomonobu Noda
Also filed as: NODA TOMONOBU
7 granted patents·168 citations·filing 2001–2009
87Inventor score
Files withTOSHIBA KK7
Top patents by PatentIndex Score
7 records- 0195US7973281B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2009·Granted Jul 5, 2011·57 cites·18 claims
- 0295US7573066B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2007·Granted Aug 11, 2009·59 cites·2 claims
- 0392US7221991B2System and method for monitoring manufacturing apparatusesTOSHIBA KK·Filed 2005·Granted May 22, 2007·24 cites·9 claims
- 0466US6583870B2Simulated defective wafer and pattern defect inspection recipe preparing methodTOSHIBA KK·Filed 2001·Granted Jun 24, 2003·11 cites·20 claims
- 0559US6671861B2Manufacturing process evaluation method for semiconductor device and pattern shape evaluation apparatus using the evaluation methodTOSHIBA KK·Filed 2002·Granted Dec 30, 2003·9 cites·11 claims
- 0656US6711733B2System for and method of evaluating mask patternsTOSHIBA KK·Filed 2002·Granted Mar 23, 2004·5 cites·20 claims
- 0750US6657735B2Method of evaluating critical locations on a semiconductor apparatus patternTOSHIBA KK·Filed 2001·Granted Dec 2, 2003·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →