Inventor · disambiguated record
Nicholas J. Kepler
Also filed as: KEPLER NICHOLAS · KEPLER NICHOLAS J · KEPLER NICHOLAS JOHN
16 granted patents·260 citations·filing 1997–2002
94Inventor score
Top patents by PatentIndex Score
16 records- 0182US6600333B1Method and test structure for characterizing sidewall damage in a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 29, 2003·28 cites·10 claims
- 0281US6383906B1Method of forming junction-leakage free metal salicide in a semiconductor wafer with ultra-low silicon consumptionADVANCED MICRO DEVICES INC·Filed 2000·Granted May 7, 2002·29 cites·11 claims
- 0377US6500755B2Resist trim process to define small openings in dielectric layersADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 31, 2002·18 cites·23 claims
- 0476US6268255B1Method of forming a semiconductor device with metal silicide regionsADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 31, 2001·22 cites·56 claims
- 0570US6287953B1Minimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 11, 2001·12 cites·22 claims
- 0668US7026691B1Minimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 11, 2006·10 cites·20 claims
- 0766US5796651AMemory device using a reduced word line voltage during read operations and a method of accessing such a memory deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Aug 18, 1998·25 cites·20 claims
- 0865US6051881AForming local interconnects in integrated circuitsADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 18, 2000·32 cites·9 claims
- 0960US7737021B1Resist trim process to define small openings in dielectric layersGLOBALFOUNDRIES INC·Filed 2002·Granted Jun 15, 2010·6 cites·26 claims
- 1057US5844836AMemory cell having increased capacitance via a local interconnect to gate capacitor and a method for making such a cellADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 1, 1998·17 cites·20 claims
- 1155US6406993B1Method of defining small openings in dielectric layersADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 18, 2002·7 cites·28 claims
- 1253US6146954AMinimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·18 cites·20 claims
- 1353US6046088AMethod for self-aligning polysilicon gates with field isolation and the resultant structureADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 4, 2000·19 cites·10 claims
- 1451US6313538B1Semiconductor device with partial passivation layerADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 6, 2001·4 cites·9 claims
- 1539US6191034B1Forming minimal size spaces in integrated circuit conductive linesADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 20, 2001·7 cites·12 claims
- 1637US5930659AForming minimal size spaces in integrated circuit conductive linesADVANCED MICRODEVICES INC·Filed 1997·Granted Jul 27, 1999·6 cites·12 claims
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