Inventor · disambiguated record
Frank Pietzschmann
Also filed as: PIETZSCHMANN FRANK
3 granted patents·1 pending application·108 citations·filing 2001–2008
72Inventor score
Top patents by PatentIndex Score
4 records- 0190US6784678B2Test apparatus for semiconductor circuit and method of testing semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 31, 2004·94 cites·26 claims
- 0264US7785935B2Manufacturing method for forming an integrated circuit device and corresponding integrated circuit deviceQIMONDA AG·Filed 2007·Granted Aug 31, 2010·3 cites·12 claims
- 0362US7212019B2Probe needle for testing semiconductor chips and method for producing said probe needleINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 1, 2007·11 cites·19 claims
- 0437US2009079450A1Semiconductor test deviceQIMONDA AG·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →