Inventor · disambiguated record
Jan Zieleman
Also filed as: ZIELEMAN JAN · ZIELEMAN JAN G
8 granted patents·2 pending applications·36 citations·filing 2001–2006
84Inventor score
Top patents by PatentIndex Score
10 records- 0178US7299388B2Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor waferINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 20, 2007·7 cites·14 claims
- 0269US7366047B2Method and apparatus for reducing standby current in a dynamic random access memory during self refreshINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 29, 2008·8 cites·20 claims
- 0361US7457177B2Random access memory including circuit to compress comparison resultsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 25, 2008·5 cites·21 claims
- 0457US7313033B2Random access memory including first and second voltage sourcesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 25, 2007·4 cites·29 claims
- 0554US7539911B2Test mode for programming rate and precharge time for DRAM activate-precharge cycleINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 26, 2009·3 cites·43 claims
- 0651US7085191B2Simulating a floating wordline condition in a memory device, and related techniquesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 1, 2006·6 cites·34 claims
- 0747US7408833B2Simulating a floating wordline condition in a memory device, and related techniquesINFINEON TECHNOLOGIES AG·Filed 2006·Granted Aug 5, 2008·1 cites·12 claims
- 0847US7362632B2Test parallelism increase by tester controllable switching of chip select groupsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 22, 2008·2 cites·20 claims
- 0939US2003087492A1Semiconductor device and method of manufacturing the samePROMOS TECHNOLOGIES INC·Filed 2001·Application pending·0 cites
- 1032US2003234659A1Electrical isolation between pins sharing the same tester channelPROMOS TECHNOLOGIES·Filed 2002·Application pending·0 cites
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