Inventor · disambiguated record
Sim Y. Loo
Also filed as: LOO SIM Y
3 granted patents·22 citations·filing 2007–2014
63Inventor score
Top patents by PatentIndex Score
3 records- 0187US8626480B2Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factorsCHANG PAUL·Filed 2009·Granted Jan 7, 2014·20 cites·23 claims
- 0271US9639652B2Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factorsGLOBALFOUNDRIES INC·Filed 2014·Granted May 2, 2017·2 cites·26 claims
- 0342US8032349B2Efficient methodology for the accurate generation of customized compact model parameters from electrical test dataIBM·Filed 2007·Granted Oct 4, 2011·0 cites·15 claims
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