Inventor · disambiguated record
Young-Gi Min
Also filed as: MIN YOUNG-GI
2 granted patents·1 pending application·1 citations·filing 2015–2018
31Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0167US9983229B2Test socket for testing semiconductor chip package and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 29, 2018·1 cites·19 claims
- 0245US10470315B2Manufacturing method of test socket and test method for semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 5, 2019·0 cites·18 claims
- 0335US2019164851A1Test interface board and system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →