Inventor · disambiguated record
Victor Chih Yuan Chang
Also filed as: CHANG VICTOR C Y · CHANG VICTOR CHIH YUAN
7 granted patents·2 pending applications·342 citations·filing 2002–2014
85Inventor score
Top patents by PatentIndex Score
9 records- 0197US6854100B1Methodology to characterize metal sheet resistance of copper damascene processTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Feb 8, 2005·313 cites·17 claims
- 0292US8809073B2Apparatus and methods for de-embedding through substrate viasYEN HSIAO-TSUNG·Filed 2011·Granted Aug 19, 2014·12 cites·11 claims
- 0388US7772868B2Accurate capacitance measurement for ultra large scale integrated circuitsTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Aug 10, 2010·9 cites·7 claims
- 0482US8115500B2Accurate capacitance measurement for ultra large scale integrated circuitsDOONG YIH-YUH·Filed 2011·Granted Feb 14, 2012·5 cites·11 claims
- 0568US7880494B2Accurate capacitance measurement for ultra large scale integrated circuitsTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 1, 2011·1 cites·6 claims
- 0666US9121891B2Apparatus and methods for de-embedding through substrate viasTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Sep 1, 2015·1 cites·20 claims
- 0748US7028277B2Process related deviation corrected parasitic capacitance modeling methodTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 11, 2006·1 cites·20 claims
- 0845US2007266360A1Metal Thickness Simulation for Improving RC Extraction AccuracyTAIWAN SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
- 0942US2007257339A1Shield structuresTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →