Inventor · disambiguated record
Yosuke Kawamata
Also filed as: KAWAMATA YOSUKE
3 granted patents·4 pending applications·25 citations·filing 2001–2009
67Inventor score
Top patents by PatentIndex Score
7 records- 0183US7436718B2Semiconductor memory device including fuse detection circuit to determine successful fuse-cutting rate for optical fuse-cutting conditionsELPIDA MEMORY INC·Filed 2006·Granted Oct 14, 2008·18 cites·16 claims
- 0260US7656220B2Semiconductor device employing fuse circuit and method for selecting fuse circuit systemELPIDA MEMORY INC·Filed 2005·Granted Feb 2, 2010·3 cites·9 claims
- 0338US6684355B2Memory testing apparatus and methodNEC CORP·Filed 2001·Granted Jan 27, 2004·4 cites·14 claims
- 0436US2009166163A1Push switchCALSONIC KANSEI CORP·Filed 2007·Application pending·0 cites
- 0535US2010013509A1Prober and semiconductor wafer testing method using the sameELPIDA MEMORY INC·Filed 2009·Application pending·0 cites
- 0632US2007241765A1Probe card and measuring method for semiconductor wafersELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 0730US2007216429A1Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe cardELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →