Inventor · disambiguated record

Gook-Tae Son

Also filed as: SON GOOK-TAE

1 granted patent·15 citations·filing 2002–2002

36Inventor score

Technology areasH10P

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0169US6985830B2Method of measuring the probability of failure caused only by defects, method of measuring defect limited yield, and system using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 10, 2006·15 cites·19 claims

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