Inventor · disambiguated record

Kazuhiko Shimabayashi

Also filed as: SHIMABAYASHI KAZUHIKO

3 granted patents·11 citations·filing 2006–2011

56Inventor score

Technology areasG01R H10P

Files withFUJITSU MICROELECTRONICS LTD1 MARUYAMA YUJI1 MIMURA CHIAKI1

Top patents by PatentIndex Score

3 records

0177US7495464B2Inspection device of a semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Feb 24, 2009·11 cites·9 claims
0241US8159250B2Testing device for testing a semiconductor deviceMARUYAMA YUJI·Filed 2009·Granted Apr 17, 2012·0 cites·6 claims
0326US8754667B2Semiconductor device test method and semiconductor deviceMIMURA CHIAKI·Filed 2011·Granted Jun 17, 2014·0 cites·15 claims

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