Inventor · disambiguated record
Tatsumi Nakada
Also filed as: NAKADA TATSUMI
10 granted patents·1 pending application·281 citations·filing 1994–2015
91Inventor score
Files withFUJITSU LTD11
Top patents by PatentIndex Score
11 records- 0182US7353440B2Multicore processor test methodFUJITSU LTD·Filed 2004·Granted Apr 1, 2008·39 cites·30 claims
- 0272US6754813B1Apparatus and method of processing information for suppression of branch predictionFUJITSU LTD·Filed 2000·Granted Jun 22, 2004·19 cites·11 claims
- 0370US5745533AApparatus and method for adjusting the skew of a timing signal using propagation delay time of signals generated by a ring oscillator forming a digital circuitFUJITSU LTD·Filed 1995·Granted Apr 28, 1998·77 cites·25 claims
- 0463US5572662AData processing apparatusFUJITSU LTD·Filed 1995·Granted Nov 5, 1996·49 cites·14 claims
- 0558US7330961B2Cache control method and processor systemFUJITSU LTD·Filed 2004·Granted Feb 12, 2008·7 cites·16 claims
- 0657US6055625APipeline computer with a scoreboard control circuit to prevent interference between registersFUJITSU LTD·Filed 1997·Granted Apr 25, 2000·37 cites·2 claims
- 0755US5638526AApparatus for operand data bypassing having previous operand storage register connected between arithmetic input selector and arithmetic unitFUJITSU LTD·Filed 1994·Granted Jun 10, 1997·29 cites·7 claims
- 0841US5634136AData processor and method of controlling the sameFUJITSU LTD·Filed 1995·Granted May 27, 1997·15 cites·10 claims
- 0939US2005144409A1Data processing device and method utilizing latency difference between memory blocksFUJITSU LTD·Filed 2005·Application pending·0 cites
- 1034US9823291B2Semiconductor device and method of testing semiconductor deviceFUJITSU LTD·Filed 2015·Granted Nov 21, 2017·0 cites·5 claims
- 1134US5781433ASystem for detecting failure in information processing deviceFUJITSU LTD·Filed 1995·Granted Jul 14, 1998·9 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →