Inventor · disambiguated record
Chun-Fan Dai
Also filed as: DAI CHUN-FAN
3 granted patents·2 citations·filing 2012–2013
49Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0163US9726713B2Testing method and testing system for semiconductor elementIND TECH RES INST·Filed 2013·Granted Aug 8, 2017·2 cites·10 claims
- 0241US9341669B2Testing apparatusIND TECH RES INST·Filed 2013·Granted May 17, 2016·0 cites·24 claims
- 0337US9110125B2Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Aug 18, 2015·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →