Inventor · disambiguated record
Pei-Ting Chou
Also filed as: CHOU PEI-TING
4 granted patents·4 citations·filing 2012–2013
60Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0163US9726713B2Testing method and testing system for semiconductor elementIND TECH RES INST·Filed 2013·Granted Aug 8, 2017·2 cites·10 claims
- 0263US9557368B2Method of measuring thermal electric characteristics of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Jan 31, 2017·2 cites·19 claims
- 0341US9341669B2Testing apparatusIND TECH RES INST·Filed 2013·Granted May 17, 2016·0 cites·24 claims
- 0437US9110125B2Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Aug 18, 2015·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →