Inventor · disambiguated record
Su-Wei Tsai
Also filed as: TSAI SU-WEI
5 granted patents·1 pending application·14 citations·filing 2007–2013
72Inventor score
Technology areasG01R
Top patents by PatentIndex Score
6 records- 0168US7855567B2Electronic device testing system and methodTEST RESEARCH INC·Filed 2008·Granted Dec 21, 2010·6 cites·23 claims
- 0266US7702982B2Electronic device testing system and methodTEST RESEARCH INC·Filed 2007·Granted Apr 20, 2010·5 cites·15 claims
- 0364US8350575B2Electrical connection defect detection system and methodTEST RESEARCH INC·Filed 2010·Granted Jan 8, 2013·2 cites·12 claims
- 0453US8324908B2Electrical connection defect detection deviceTSAI SU-WEI·Filed 2010·Granted Dec 4, 2012·1 cites·14 claims
- 0538US2014225633A1Fixture, system and method for performing functional testTEST RESEARCH INC·Filed 2013·Application pending·0 cites
- 0637US8843357B2Electrical connection defect simulation test method and system of the sameTSAI SU-WEI·Filed 2011·Granted Sep 23, 2014·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →